- 专利标题: Systems and methods for the inspection of contact lenses
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申请号: US15792568申请日: 2017-10-24
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公开(公告)号: US10215662B2公开(公告)日: 2019-02-26
- 发明人: Stephen Donald Newman , Hiroyama Oyama , Johannes Pfund , Juergen Lamprecht
- 申请人: MENICON SINGAPORE PTE LTD.
- 申请人地址: SG Singapore
- 专利权人: MENICON SINGAPORE PTE LTD.
- 当前专利权人: MENICON SINGAPORE PTE LTD.
- 当前专利权人地址: SG Singapore
- 代理机构: Dorsey & Whitney LLP
- 优先权: SG201203439 20120510
- 主分类号: G01M11/02
- IPC分类号: G01M11/02 ; G01N21/88 ; G01N21/958 ; G01N21/03
摘要:
An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.
公开/授权文献
- US20180045604A1 SYSTEMS AND METHODS FOR THE INSPECTION OF CONTACT LENSES 公开/授权日:2018-02-15
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