- 专利标题: Precision inclinometer with parallel dipole line trap system
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申请号: US15198183申请日: 2016-06-30
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公开(公告)号: US10234286B2公开(公告)日: 2019-03-19
- 发明人: Oki Gunawan
- 申请人: International Business Machines Corporation
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Michael J. Chang, LLC
- 代理商 Vazken Alexanian
- 主分类号: G01C9/06
- IPC分类号: G01C9/06 ; G06T7/00
摘要:
Inclinometers with a parallel dipole line (PDL) trap system are provided. In one aspect, an inclinometer includes: a PDL trap having a pair of dipole line magnets, a transparent tube in between the dipole line magnets, and a diamagnetic object within the transparent tube, wherein the diamagnetic object is levitating in between the dipole line magnets; and a sensing system for determining a position z of the diamagnetic object in the PDL trap and for determining an inclination angle θ using the position z of the diamagnetic object in the PDL trap. Techniques to detect the diamagnetic object position using optical, capacitive and manual methods are described. A method for determining an inclination angle θ using the present inclinometers is also provided.
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