Device and method for measuring plant growth conditions
Abstract:
A device (10) and method are provided for measuring the plant growth conditions within a substrate. A first and a second linear arrays of probes (16, 18) are used, allowing multiple measurements of properties of the substrate. Using multiple measurements at different levels in the substrate and then combining these multiple measurements, allows plant growth conditions to be accurately derived.
Public/Granted literature
Information query
Patent Agency Ranking
0/0