Invention Grant
- Patent Title: Inspection method and inspection device for RFID tag
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Application No.: US14266973Application Date: 2014-05-01
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Publication No.: US10235544B2Publication Date: 2019-03-19
- Inventor: Tsuyoshi Mukai , Yuya Dokai
- Applicant: Murata Manufacturing Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Keating & Bennett, LLP
- Priority: JP2012-092359 20120413
- Main IPC: H04Q5/22
- IPC: H04Q5/22 ; G06K7/10

Abstract:
An RFID tag inspection method includes the steps of transmitting a measurement signal from a reader/writer simultaneously to a plurality of RFID tags arrayed on a collective base member and configured to process radio signals, receiving response waves from the individual RFID tags in a batch by the reader/writer, and determining, based on strengths and a number of received signals read by the reader/writer, whether or not the individual RFID tags are acceptable. Thus, acceptance/rejection inspection can be performed on the plural RFID tags, which are arrayed on the collective base member, in a batch.
Public/Granted literature
- US20140232532A1 INSPECTION METHOD AND INSPECTION DEVICE FOR RFID TAG Public/Granted day:2014-08-21
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