Invention Grant
- Patent Title: Measuring device, measuring method, and programs therefor
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Application No.: US15283804Application Date: 2016-10-03
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Publication No.: US10240976B2Publication Date: 2019-03-26
- Inventor: Hiroki Nagashima , Atsushi Shoji , Akira Oide
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Itabashi-ku
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Itabashi-ku
- Agency: Xsensus LLP
- Priority: JP2015-197594 20151005
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01J1/42 ; G01J1/44 ; G01J1/02 ; G01B11/00 ; G01S17/42 ; G01S7/481

Abstract:
A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat.
Public/Granted literature
- US20170097260A1 MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR Public/Granted day:2017-04-06
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