Invention Grant
- Patent Title: Electronic device and method of analyzing fragmentation of electronic device
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Application No.: US15126208Application Date: 2015-05-26
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Publication No.: US10241718B2Publication Date: 2019-03-26
- Inventor: Sungjong Seo , Jongmin Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd
- Current Assignee: Samsung Electronics Co., Ltd
- Current Assignee Address: KR
- Agency: The Farrell Law Firm, P.C.
- Priority: KR10-2014-0062903 20140526
- International Application: PCT/KR2015/005233 WO 20150526
- International Announcement: WO2015/182947 WO 20151203
- Main IPC: G06F12/00
- IPC: G06F12/00 ; G06F3/06 ; G06F12/02 ; G06F17/00
Abstract:
Disclosed is a method of analyzing fragmentation of an electronic device, which comprises: receiving information on at least one allocation unit of a memory; and calculating fragmentation ratio information on the basis of the received information on at least one allocation unit.
Public/Granted literature
- US20170083261A1 ELECTRONIC DEVICE AND METHOD OF ANALYZING FRAGMENTATION OF ELECTRONIC DEVICE Public/Granted day:2017-03-23
Information query
