- Patent Title: Multichip debugging method and multichip system adopting the same
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Application No.: US15378871Application Date: 2016-12-14
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Publication No.: US10255150B2Publication Date: 2019-04-09
- Inventor: Jong-min Kim , Chan-ho Yoon , Jung-pil Lee , Hyung-joon Park , Jae-ho Sim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0178509 20151214
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/22 ; G06F11/36 ; G06F11/273 ; G06F11/07 ; H01L23/544

Abstract:
Provided are a multichip debugging method and a multichip system adopting the same. The multichip system includes: a first chip including a first debugging port and first identification (ID) information, a second chip including a second debugging port and second ID information, and a test access port (TAP) electrically connected to the first debugging port and the second debugging port and configured to connect to a test apparatus via the TAP.
Public/Granted literature
- US20170168910A1 MULTICHIP DEBUGGING METHOD AND MULTICHIP SYSTEM ADOPTING THE SAME Public/Granted day:2017-06-15
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