Invention Grant
- Patent Title: Determination method, determination system, determination device, and program
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Application No.: US15507322Application Date: 2015-08-31
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Publication No.: US10262427B2Publication Date: 2019-04-16
- Inventor: Toru Takahashi , Rui Ishiyama
- Applicant: NEC Corporation
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2014-177408 20140901
- International Application: PCT/JP2015/074773 WO 20150831
- International Announcement: WO2016/035774 WO 20160310
- Main IPC: G06K9/48
- IPC: G06K9/48 ; G06K9/80 ; G06T7/35 ; G06Q20/40 ; G06T7/00 ; G07G1/00 ; G06K9/00 ; G06K9/20

Abstract:
The present invention addresses the problem of providing a technique for determining the authenticity of a product without requiring a special device such as an integrated circuit (IC) tag. A means for solving this problem according to the invention is characterized by determining the authenticity of a target product on the basis of the validity of the association between the body of the product and a surface-treated component that is mounted to the body and that has been validated.
Public/Granted literature
- US20170287147A1 DETERMINATION METHOD, DETERMINATION SYSTEM, DETERMINATION DEVICE, AND PROGRAM Public/Granted day:2017-10-05
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