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公开(公告)号:US11983864B2
公开(公告)日:2024-05-14
申请号:US17269583
申请日:2018-08-23
Applicant: NEC Corporation
Inventor: Rui Ishiyama
IPC: G06K9/46 , A61J3/00 , G06T7/00 , G06T7/33 , G06T7/70 , G06V10/22 , G06V10/24 , G06V10/44 , G06V10/75 , G06V20/64 , G06V20/80
CPC classification number: G06T7/001 , A61J3/007 , G06T7/344 , G06T7/70 , G06V10/225 , G06V10/24 , G06V10/44 , G06V10/75 , G06V20/647 , G06V20/80 , A61J2205/30 , A61J2205/40
Abstract: An object matching device includes an acquiring unit, an extracting unit, and a determining unit. The acquiring unit acquires an image of an object to be matched with a character printed thereon. The extracting unit extracts a partial image of predetermined size including the character as a matching partial image from the image. The determining unit compares the matching partial image with a registration partial image acquired from an object to be registered and registered in advance, and thereby determines an identity of the object to be matched and the object to be registered.
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公开(公告)号:US11854185B2
公开(公告)日:2023-12-26
申请号:US17296019
申请日:2018-11-29
Applicant: NEC Corporation
Inventor: Yuta Kudo , Rui Ishiyama , Toru Takahashi , Kengo Makino
Abstract: An individual identification apparatus that identifies an individual product having a pattern of irregularities randomly formed on a surface thereof includes an imaging unit and an extracting unit. The imaging unit is configured to acquire an image obtained by capturing a date mark formed on the product. The extracting unit is configured to extract a feature value related to the pattern of the irregularities from the image as data identifying the individual product.
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公开(公告)号:US11651582B2
公开(公告)日:2023-05-16
申请号:US17278470
申请日:2018-09-26
Applicant: NEC Corporation
Inventor: Toru Takahashi , Yuta Kudo , Kengo Makino , Rui Ishiyama
CPC classification number: G06V10/751 , G06K9/6215 , G06T7/337 , G06T7/40 , G06T7/80 , G06V10/40
Abstract: An individual identification system includes: a storing unit for storing an image capture parameter in association with data characterizing a surface of a reference object; an acquiring unit that, when data characterizing a surface of an object to be matched is input, calculates an approximation degree between the input data and each data stored in the storing unit, and acquires the image capture parameter applied to the object to be matched from the storing unit based on the calculated approximation degree; a condition setting unit that sets an image capture condition determined by the acquired image capture parameter; an image capturing unit that acquires an image of the surface of the object to be matched under the set image capture condition; an extracting unit that extracts a feature value from the acquired image; and a matching unit that matches the extracted feature value against a registered feature value.
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公开(公告)号:US11302016B2
公开(公告)日:2022-04-12
申请号:US16351151
申请日:2019-03-12
Applicant: NEC Corporation
Inventor: Toru Takahashi , Rui Ishiyama
Abstract: The present invention addresses the problem of providing a technique for determining the authenticity of a product without requiring a special device such as an integrated circuit (IC) tag. A means for solving this problem according to the invention is characterized by determining the authenticity of a target product on the basis of the validity of the association between the body of the product and a surface-treated component that is mounted to the body and that has been validated.
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公开(公告)号:US20220109811A1
公开(公告)日:2022-04-07
申请号:US17551342
申请日:2021-12-15
Applicant: NEC Corporation
Inventor: Rui Ishiyama , Toru Takahashi
Abstract: The present invention addresses the problem of providing technology that makes it possible to perform verification for the purposes of distribution management, authenticity assessment, and the like of merchandise without building an RFID chip into each of a plurality of fasteners. The present invention is characterized in that image characteristics of a component of a product to be verified are acquired and the product to be verified is verified on the basis of the acquired image characteristics of the component.
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公开(公告)号:US10666905B2
公开(公告)日:2020-05-26
申请号:US14409868
申请日:2013-06-21
Applicant: NEC Corporation
Inventor: Rui Ishiyama , Toru Takahashi
Abstract: The present invention addresses the problem of providing technology that makes it possible to perform verification for the purposes of distribution management, authenticity assessment, and the like of merchandise without building an RFID chip into each of a plurality of fasteners. The present invention is characterized in that image characteristics of a component of a product to be verified are acquired and the product to be verified is verified on the basis of the acquired image characteristics of the component.
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公开(公告)号:US10433119B2
公开(公告)日:2019-10-01
申请号:US15562470
申请日:2016-04-08
Applicant: NEC Corporation
Inventor: Rui Ishiyama
IPC: H04W4/02 , H04W4/04 , G05D1/02 , G06K9/46 , G06K9/52 , G06K9/62 , G06T7/60 , G06K9/32 , G06T7/73 , H04W4/33 , G06K9/00 , G01C21/20 , G06K9/36
Abstract: A position determining device is equipped with a matching unit. The matching unit matches a random pattern in a photographed image of a portion of a ceiling or floor photographed by a portable terminal against a random pattern in a photographed image of a larger area of the ceiling or floor than the aforementioned portion so as to determine the position of the photographed image of the aforementioned portion on the photographed image of the larger area. The matching unit determines the position of the ceiling located above the portable terminal or the position of the floor located therebelow on the basis of the identified position on the photographed image of the larger area.
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公开(公告)号:US12196545B2
公开(公告)日:2025-01-14
申请号:US17764697
申请日:2019-10-04
Applicant: NEC Corporation
Inventor: Toru Takahashi , Rui Ishiyama , Kengo Makino , Takashi Shibata
Abstract: A surface property estimation system includes an image acquisition means for acquiring an image of a surface of an object, an estimation means for estimating a surface property from the acquired image by using an estimation model obtained through machine learning with use of an image of a surface of an object and a surface property shown by the image as training data, an extraction means for extracting, from the acquired image, a feature amount unique to the image, and a registration means for storing the estimated surface property and the extracted feature amount in a storage means in association with each other.
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公开(公告)号:US12190497B2
公开(公告)日:2025-01-07
申请号:US17761679
申请日:2020-03-30
Applicant: NEC Corporation
Inventor: Kengo Makino , Toru Takahashi , Rui Ishiyama
IPC: G06T7/00 , G06F16/583 , G06T7/38
Abstract: A registration means for storing an image of a product as a registration image in association with information representing the passing sequence that the product passed through an upstream side process; a management means for managing the matching sequence in a downstream side process; and a matching means for performing matching between an image of a product carried into the downstream side process and the registration image according to the matching sequence, are included. Each time the matching means succeeds in matching, the management means updates the matching sequence to sequence in which registration images not having succeeded in matching with any matching image are put in order on the basis of the passing sequence that the products passed through the upstream side process.
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公开(公告)号:US11941849B2
公开(公告)日:2024-03-26
申请号:US17430533
申请日:2019-02-15
Applicant: NEC Corporation
Inventor: Yuta Kudo , Rui Ishiyama , Toru Takahashi , Kengo Makino
CPC classification number: G06T7/80 , G06T7/0002 , H04N23/56 , H04N23/71 , H04N23/74
Abstract: An information processing device, to be used in an image capturing device that illuminates an object by an illumination means and captures reflected light from the object as a reflection image by a capturing means, includes a determination means for determining an irradiation angle range for irradiating the object by the illumination means, on the basis of two types of inclination statistic values that are values corresponding to the inclination distribution of the unevenness existing on a surface of the object.
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