Invention Grant
- Patent Title: Semiconductor device and manufacturing method thereof
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Application No.: US15061627Application Date: 2016-03-04
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Publication No.: US10269697B2Publication Date: 2019-04-23
- Inventor: Kuo-Yen Liu , Boo Yeh , Min-Chang Liang , Jui-Yao Lai , Sai-Hooi Yeong , Ying-Yan Chen , Yen-Ming Chen
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: McDermott Will & Emery, LLP
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L21/768 ; H01L23/528 ; H01L23/532

Abstract:
A semiconductor device includes a plurality of lower conductive lines overlying a substrate and extending in a first direction, an insulating layer overlying the plurality of lower conductive lines, a plurality of upper conductive lines overlying the insulating layer and the first conductive lines and extending in a second direction crossing the first direction, and a plurality of vias filled with a conductive material formed in the insulating layer. The plurality of upper conductive lines are arranged in the first direction with a first pitch. The plurality of vias includes first vias and second vias. At least one via of the first vias connects at least two lines of the plurality of lower conductive lines and one line of the plurality of upper conductive lines. An average width in the first direction of the first vias is different from an average width in the first direction of the second vias.
Public/Granted literature
- US10157826B2 Semiconductor device and manufacturing method thereof Public/Granted day:2018-12-18
Information query
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