- 专利标题: Semiconductor device and manufacturing method thereof
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申请号: US15061627申请日: 2016-03-04
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公开(公告)号: US10269697B2公开(公告)日: 2019-04-23
- 发明人: Kuo-Yen Liu , Boo Yeh , Min-Chang Liang , Jui-Yao Lai , Sai-Hooi Yeong , Ying-Yan Chen , Yen-Ming Chen
- 申请人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 申请人地址: TW Hsinchu
- 专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- 当前专利权人地址: TW Hsinchu
- 代理机构: McDermott Will & Emery, LLP
- 主分类号: H01L23/522
- IPC分类号: H01L23/522 ; H01L21/768 ; H01L23/528 ; H01L23/532
摘要:
A semiconductor device includes a plurality of lower conductive lines overlying a substrate and extending in a first direction, an insulating layer overlying the plurality of lower conductive lines, a plurality of upper conductive lines overlying the insulating layer and the first conductive lines and extending in a second direction crossing the first direction, and a plurality of vias filled with a conductive material formed in the insulating layer. The plurality of upper conductive lines are arranged in the first direction with a first pitch. The plurality of vias includes first vias and second vias. At least one via of the first vias connects at least two lines of the plurality of lower conductive lines and one line of the plurality of upper conductive lines. An average width in the first direction of the first vias is different from an average width in the first direction of the second vias.
公开/授权文献
- US10157826B2 Semiconductor device and manufacturing method thereof 公开/授权日:2018-12-18
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