Invention Grant
- Patent Title: Method and system for scene scanning
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Application No.: US15377381Application Date: 2016-12-13
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Publication No.: US10281265B2Publication Date: 2019-05-07
- Inventor: Chen-Hao Wei , Wen-Shiou Luo
- Applicant: Industrial Technology Research Institute
- Applicant Address: TW Chutung, Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Chutung, Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW105129754A 20160913
- Main IPC: H04N1/04
- IPC: H04N1/04 ; G06T17/00 ; G01B11/25

Abstract:
A scene scanning method and a scene scanning system, adapted to obtain information for reconstructing a 3D model, are provided. The method comprises projecting, by a characteristic projecting unit, a characteristic pattern by applying an invisible light in a scene; capturing, by a sensing unit, a data of the scene and the characteristic pattern; and receiving, by a processing unit, the data of the scene and the characteristic pattern captured by the sensing unit.
Public/Granted literature
- US20180077405A1 METHOD AND SYSTEM FOR SCENE SCANNING Public/Granted day:2018-03-15
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