Invention Grant
- Patent Title: Systems for quality monitoring of additive manufacturing
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Application No.: US14818832Application Date: 2015-08-05
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Publication No.: US10295502B2Publication Date: 2019-05-21
- Inventor: Patrick L. Clavette , Michael A. Klecka , Aaron T. Nardi , Greg C. Ojard
- Applicant: Delavan Inc
- Applicant Address: US IA West Des Moines
- Assignee: Delavan Inc.
- Current Assignee: Delavan Inc.
- Current Assignee Address: US IA West Des Moines
- Agency: Locke Lord LLP
- Agent Daniel J. Fiorello; Scott D. Wofsy
- Main IPC: G01N29/14
- IPC: G01N29/14 ; G01N29/44 ; G01N29/04 ; G01N29/06 ; B33Y50/02 ; B33Y40/00 ; C23C24/04 ; B29C64/153 ; B22F3/00

Abstract:
A system for quality monitoring of additive manufacturing includes an acoustic emission (AE) sensor configured to be attached to an additive manufacturing substrate and to output a sensor signal indicative of acoustic vibrations received at the AE sensor and an AE module. The AE module is configured to receive the sensor signal from the AE sensor and process the sensor signal to determine at least one characteristic of an additive manufacturing process and/or an additively manufactured article.
Public/Granted literature
- US20170038342A1 SYSTEMS FOR QUALITY MONITORING OF ADDITIVE MANUFACTURING Public/Granted day:2017-02-09
Information query