Invention Grant
- Patent Title: Integrated circuit current metering using voltage variation detection circuit
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Application No.: US15474635Application Date: 2017-03-30
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Publication No.: US10296063B2Publication Date: 2019-05-21
- Inventor: Yifan YangGong , Sebastian Turullols , Vijay Srinivasan
- Applicant: Oracle International Corporation
- Applicant Address: US CA Redwood Shores
- Assignee: Oracle International Corporation
- Current Assignee: Oracle International Corporation
- Current Assignee Address: US CA Redwood Shores
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Main IPC: G06F1/324
- IPC: G06F1/324 ; G06F1/3206 ; G06F1/3296

Abstract:
An apparatus is disclosed, including a monitoring circuit, a translation circuit, a first filter circuit, a second filter circuit, and an interface. The monitoring circuit may be configured to receive a plurality of code values indicative of a voltage level of a power supply signal. The translation circuit may be configured to translate a particular code value to a corresponding voltage value of a plurality of voltage values. The first filter circuit may be configured to filter one or more of the plurality of voltage values to generate a plurality of filtered voltage values. The second filter circuit may be configured to generate a plurality of current values using one or more of the plurality of filtered voltage values and based on an impulse response of the power supply signal. The interface may be configured to send one or more of the plurality of current values to a functional circuit.
Public/Granted literature
- US20180284867A1 INTEGRATED CIRCUIT CURRENT METERING USING VOLTAGE VARIATION DETECTION CIRCUIT Public/Granted day:2018-10-04
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