Invention Grant
- Patent Title: Fusible instructions and logic to provide or-test and and-test functionality using multiple test sources
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Application No.: US15340916Application Date: 2016-11-01
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Publication No.: US10296347B2Publication Date: 2019-05-21
- Inventor: Maxim Loktyukhin , Robert Valentine , Julian C. Horn , Mark J. Charney
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Nicholson De Vos Webster & Elliott LLP
- Main IPC: G06F9/30
- IPC: G06F9/30 ; G06F9/38

Abstract:
Fusible instructions and logic provide OR-test and AND-test functionality on multiple test sources. Some embodiments include a processor decode stage to decode a test instruction for execution, the instruction specifying first, second and third source data operands, and an operation type. Execution units, responsive to the decoded test instruction, perform one logical operation, according to the specified operation type, between data from the first and second source data operands, and perform a second logical operation between the data from the third source data operand and the result of the first logical operation to set a condition flag. Some embodiments generate the test instruction dynamically by fusing one logical instruction with a prior-art test instruction. Other embodiments generate the test instruction through a just-in-time compiler. Some embodiments also fuse the test instruction with a subsequent conditional branch instruction, and perform a branch according to how the condition flag is set.
Public/Granted literature
- US20170052788A1 FUSIBLE INSTRUCTIONS AND LOGIC TO PROVIDE OR-TEST AND AND-TEST FUNCTIONALITY USING MULTIPLE TEST SOURCES Public/Granted day:2017-02-23
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