Invention Grant
- Patent Title: Method for calculating a height map of a body of transparent material having an inclined or curved surface
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Application No.: US14737806Application Date: 2015-06-12
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Publication No.: US10302415B2Publication Date: 2019-05-28
- Inventor: Johannes Anna Quaedackers
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: EP14172385 20140613
- Main IPC: G01B5/18
- IPC: G01B5/18 ; G01B7/26 ; G01B11/22 ; G01B13/14 ; G01B21/18 ; G01B11/06 ; G01B11/24 ; G01B9/02

Abstract:
Provided is a method for calculating a height map of a sample comprising a body of a transparent material having a refractive index with an inclined or curved surface, the body being provided on an underlying surface extending laterally from underneath the body. The method may include positioning a first area of a body of a transparent material with an inclined or curved surface and a second area of the underlying surface extending laterally from underneath the body under an optical profiler, measuring a height map of the first area and the second area with the optical profiler; and calculating a height map of the inclined or curved surface by using the refractive index, the measured height map of the first area and the second area.
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