- 专利标题: Method for calculating a height map of a body of transparent material having an inclined or curved surface
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申请号: US14737806申请日: 2015-06-12
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公开(公告)号: US10302415B2公开(公告)日: 2019-05-28
- 发明人: Johannes Anna Quaedackers
- 申请人: MITUTOYO CORPORATION
- 申请人地址: JP Kanagawa
- 专利权人: MITUTOYO CORPORATION
- 当前专利权人: MITUTOYO CORPORATION
- 当前专利权人地址: JP Kanagawa
- 代理机构: Greenblum & Bernstein, P.L.C.
- 优先权: EP14172385 20140613
- 主分类号: G01B5/18
- IPC分类号: G01B5/18 ; G01B7/26 ; G01B11/22 ; G01B13/14 ; G01B21/18 ; G01B11/06 ; G01B11/24 ; G01B9/02
摘要:
Provided is a method for calculating a height map of a sample comprising a body of a transparent material having a refractive index with an inclined or curved surface, the body being provided on an underlying surface extending laterally from underneath the body. The method may include positioning a first area of a body of a transparent material with an inclined or curved surface and a second area of the underlying surface extending laterally from underneath the body under an optical profiler, measuring a height map of the first area and the second area with the optical profiler; and calculating a height map of the inclined or curved surface by using the refractive index, the measured height map of the first area and the second area.
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