Invention Grant
- Patent Title: Data comparison circuit and semiconductor device
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Application No.: US15432002Application Date: 2017-02-14
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Publication No.: US10305460B2Publication Date: 2019-05-28
- Inventor: Yuki Okamoto , Yoshiyuki Kurokawa
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Fish & Richardson P.C.
- Priority: JP2016-031740 20160223
- Main IPC: H03K5/22
- IPC: H03K5/22 ; H03K5/24 ; G11C11/401 ; G11C15/04 ; H03M1/66

Abstract:
A semiconductor device that enables a memory size reduction is provided. The semiconductor device includes a converter circuit, a memory circuit, and a detection circuit. The converter circuit has a function of converting first data that includes a digital voltage value to second data that includes an analog current value. The memory circuit has a function of storing third data that includes an analog current value. The detection circuit has a function of generating data that indicates whether the analog current values of the second and third data match.
Public/Granted literature
- US20170244398A1 DATA COMPARISON CIRCUIT AND SEMICONDUCTOR DEVICE Public/Granted day:2017-08-24
Information query
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