Semiconductor device
    1.
    发明授权

    公开(公告)号:US12080377B2

    公开(公告)日:2024-09-03

    申请号:US17802281

    申请日:2021-03-04

    摘要: A semiconductor device with a novel structure is provided. The semiconductor device includes a plurality of arithmetic blocks each including an arithmetic circuit portion and a memory circuit portion. The arithmetic circuit portion and the memory circuit portion are electrically connected to each other. The arithmetic circuit portion and the memory circuit portion have an overlap region. The arithmetic circuit portion includes, for example, a Si transistor, and the memory circuit portion includes, for example, an OS transistor. The arithmetic circuit portion has a function of performing product-sum operation. The memory circuit portion has a function of retaining weight data. A first driver circuit has a function of writing the weight data to the memory circuit portion. The weight data is written to all the memory circuit portions included in the same column with the use of the first driver circuit.

    Semiconductor device, power storage device, and electronic device

    公开(公告)号:US11714138B2

    公开(公告)日:2023-08-01

    申请号:US17294780

    申请日:2019-11-12

    IPC分类号: H02J7/00 G01R31/396 H01M10/48

    摘要: A semiconductor device that tests and/or monitors each of batteries provided in an assembled battery is provided. The semiconductor device includes a hysteresis comparator and a circuit, and the circuit has a function of setting a high-level side threshold voltage and a low-level side voltage of the hysteresis comparator. The circuit includes first and second capacitors. A first terminal of the first capacitor is electrically connected to a high-level side reference potential input terminal of the hysteresis comparator and a first terminal of the second capacitor is electrically connected to a low-level side reference potential input terminal of the hysteresis comparator. After a first reference potential is input to the high-level side reference potential input terminal and a second reference potential is input to the low-level side reference potential input terminal, a negative electrode of a cell is electrically connected to each second terminal of the first and second capacitors, whereby the potential of each first terminal of the first and second capacitors is changed.

    Machine learning method, machine learning system, and display system

    公开(公告)号:US11437000B2

    公开(公告)日:2022-09-06

    申请号:US17226150

    申请日:2021-04-09

    发明人: Yuki Okamoto

    摘要: To improve the display quality of a display device. To provide a method of correcting image data input to the display device. To provide a novel image correction method or an image correction system. Machine learning for a neural network correcting image data input to the display device is performed by the following method: second image data based on an image that is displayed on the display device by input of first image data to the display device is obtained; third image data is generated by obtaining a difference between the first image data and the second image data; fourth image data is generated by adding the first image data and the third image data; and a weight coefficient is updated so that output data obtained by input of the first image data to the neural network is close to the fourth image data.

    Semiconductor device including photoelectric conversion element

    公开(公告)号:US11177299B2

    公开(公告)日:2021-11-16

    申请号:US15311261

    申请日:2015-05-27

    摘要: A solid-state imaging device with high productivity and improved dynamic range is provided. In the imaging device including a photoelectric conversion element having an i-type semiconductor layer, functional elements, and a wiring, an area where the functional elements and the wiring overlap with the i-type semiconductor in a plane view is preferably less than or equal to 35%, further preferably less than or equal to 15%, and still further preferably less than or equal to 10% of the area of the i-type semiconductor in a plane view. Plural photoelectric conversion elements are provided in the same semiconductor layer, whereby a process for separating the respective photoelectric conversion elements can be reduced. The respective i-type semiconductor layers in the plural photoelectric conversion elements are separated by a p-type semiconductor layer or an n-type semiconductor layer.

    Machine learning method, machine learning system, and display system

    公开(公告)号:US10984757B2

    公开(公告)日:2021-04-20

    申请号:US16607815

    申请日:2018-05-07

    发明人: Yuki Okamoto

    摘要: To improve the display quality of a display device. To provide a method of correcting image data input to the display device. To provide a novel image correction method or an image correction system. Machine learning for a neural network correcting image data input to the display device is performed by the following method: second image data based on an image that is displayed on the display device by input of first image data to the display device is obtained; third image data is generated by obtaining a difference between the first image data and the second image data; fourth image data is generated by adding the first image data and the third image data; and a weight coefficient is updated so that output data obtained by input of the first image data to the neural network is close to the fourth image data.

    Semiconductor device and electronic device

    公开(公告)号:US10255838B2

    公开(公告)日:2019-04-09

    申请号:US15654802

    申请日:2017-07-20

    摘要: Provided is a semiconductor device in which power consumption and rewrite time needed for changing the parameter for color adjustment, dimming, or the like are reduced. One embodiment of a semiconductor device of the present invention includes an image processing portion including a plurality of functional circuits configured to correct image data, a plurality of scan chains corresponding to the plurality of functional circuits, and a controller controlling operations of the plurality of scan chains. During a state in which the controller controls the scan chains so that one or more scan chains chosen from the plurality of scan chains are driven and the scan chains except for the one or more scan chains are not driven, a parameter stored in one or more functional circuits connected to the one or more scan chains is rewritten.