Invention Grant
- Patent Title: Method for detecting impurities in ammonium hydroxide
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Application No.: US15393731Application Date: 2016-12-29
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Publication No.: US10309937B2Publication Date: 2019-06-04
- Inventor: Kihyun Kim , Sooyeon Kim , JungDae Park , Min Soo Suh , Hyang Bong Lee , Kwangshin Lim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2016-0013616 20160203
- Main IPC: G01N30/06
- IPC: G01N30/06 ; G01N30/16 ; C01C1/28 ; G01N30/88

Abstract:
Provided is a method for detecting impurities in ammonium hydroxide. The method for detecting impurities in ammonium hydroxide includes preparing a potassium permanganate solution, preparing ammonium hydroxide, and adding the potassium permanganate solution several times to the ammonium hydroxide so as to detect impurities in the ammonium hydroxide. Potassium permanganate contained in the potassium permanganate solution is added for each time in the range of 0.0001 mol to 0.01 mol per 1 g of ammonia contained in the ammonium hydroxide.
Public/Granted literature
- US20170219538A1 METHOD FOR DETECTING IMPURITIES IN AMMONIUM HYDROXIDE Public/Granted day:2017-08-03
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