Invention Grant
- Patent Title: Apparatus and method of measuring pulse wave
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Application No.: US14757554Application Date: 2015-12-24
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Publication No.: US10314545B2Publication Date: 2019-06-11
- Inventor: Yongjoo Kwon , Jaemin Kang , Sunkwon Kim , Younho Kim , Sangyun Park , Seongho Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0188643 20141224
- Main IPC: A61B5/024
- IPC: A61B5/024 ; A61B5/00 ; A61B5/0285

Abstract:
Provided is an apparatus and method of measuring a pulse wave. The method includes: causing receivers to respectively receive pulse wave signals that are detected at two points of an object, determining an effective pulse wave signal period by using the received pulse wave signals, and obtaining a pulse transit time (PTT) between the two points by using a result obtained after comparing a magnitude of an output signal of each of the receivers with a value that is less by a predetermined percentage than a peak value of an output signal of each of the receivers during the determined effective pulse wave signal period.
Public/Granted literature
- US20160183817A1 Apparatus and method of measuring pulse wave Public/Granted day:2016-06-30
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