- 专利标题: Method and apparatus for second order intercept point (IP2) calibration
-
申请号: US15207995申请日: 2016-07-12
-
公开(公告)号: US10317535B2公开(公告)日: 2019-06-11
- 发明人: Daniel Babitch , Andrea Y. Chen , Chung Lau , Bhaskar Nallapureddy
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd
- 当前专利权人: Samsung Electronics Co., Ltd
- 当前专利权人地址: KR
- 代理机构: The Farrell Law Firm, P.C.
- 主分类号: G01S19/23
- IPC分类号: G01S19/23 ; G01S19/21
摘要:
A method and apparatus is provided. The apparatus a processor configured to generate a first square wave, generate a second square wave, wherein the first square wave and the second square wave are driven by a reference frequency oscillator, modulate a radio frequency wave with the first square wave, downconvert the modulated radio frequency wave to an intermediate frequency, filter the downconverted modulated radio frequency wave, convert the filtered downconverted modulated radio frequency wave to a digital signal, and integrate the digital signal.
公开/授权文献
信息查询