Invention Grant
- Patent Title: Technologies for temperature measurement of a processor
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Application No.: US14866884Application Date: 2015-09-26
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Publication No.: US10318396B2Publication Date: 2019-06-11
- Inventor: Jiangqi He , Hongfei Yan , Chunlei Guo , Wei Shen
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Barnes & Thornburg LLP
- Main IPC: G01K7/36
- IPC: G01K7/36 ; G01K11/26 ; G06F11/30
Abstract:
A method and device for temperature measurement of a processor is disclosed. A temperature-sensing circuit of the processor may have an associated resonance frequency, wherein the resonance frequency depends on a temperature of the temperature-sensing circuit. A temperature of the temperature-sensing circuit may be determined by determining the resonance frequency of the temperature-sensing circuit.
Public/Granted literature
- US20170091061A1 TECHNOLOGIES FOR TEMPERATURE MEASUREMENT OF A PROCESSOR Public/Granted day:2017-03-30
Information query
