Invention Grant
- Patent Title: Tilt angle measuring device
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Application No.: US15296317Application Date: 2016-10-18
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Publication No.: US10323940B2Publication Date: 2019-06-18
- Inventor: Masaki Kamiki , Goro Iwasaki , Shinji Yamaguchi , Satoshi Yanobe , Eiji Takeuchi , Yosuke Okudaira
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2015-206029 20151020
- Main IPC: G01C9/20
- IPC: G01C9/20 ; G01C9/06

Abstract:
The invention provides a tilt angle measuring device, which comprises a discoid container for including a liquid forming a free liquid surface, a light emitting source for allowing a detection light to enter the free liquid surface, a photodetector for receiving the detection light reflected on the free liquid surface and a signal processing unit for detecting a tilt of the free liquid surface based on a detection signal from the photodetector, wherein the signal processing unit sets a detection light storage time of the photodetector so that an error incidence rate of the detection signal is a predetermined value.
Public/Granted literature
- US20170108333A1 Tilt Angle Measuring Device Public/Granted day:2017-04-20
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