Invention Grant
- Patent Title: Modeling trends in crop yields
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Application No.: US15017370Application Date: 2016-02-05
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Publication No.: US10331931B2Publication Date: 2019-06-25
- Inventor: Sivan Aldor-Noiman , Erik Andrejko
- Applicant: THE CLIMATE CORPORATION
- Applicant Address: US CA San Francisco
- Assignee: The Climate Corporation
- Current Assignee: The Climate Corporation
- Current Assignee Address: US CA San Francisco
- Agency: Hickman Palermo Becker Bingham LLP
- Agent Malgorzata A. Kulczycka
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06Q10/06

Abstract:
A method and system for modeling trends in crop yields is provided. In an embodiment, the method comprises receiving, over a computer network, electronic digital data comprising yield data representing crop yields harvested from a plurality of agricultural fields and at a plurality of time points; in response to receiving input specifying a request to generate one or more particular yield data: determining one or more factors that impact yields of crops that were harvested from the plurality of agricultural fields; decomposing the yield data into decomposed yield data that identifies one or more data dependencies according to the one or more factors; generating, based on the decomposed yield data, the one or more particular yield data; generating forecasted yield data or reconstructing the yield data by incorporating the one or more particular yield data into the yield data.
Public/Granted literature
- US20170228475A1 MODELING TRENDS IN CROP YIELDS Public/Granted day:2017-08-10
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