Invention Grant
- Patent Title: Determining resistance states of memristors in a crossbar array
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Application No.: US15500051Application Date: 2015-02-24
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Publication No.: US10332595B2Publication Date: 2019-06-25
- Inventor: Yoocharn Jeon
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- International Application: PCT/US2015/017367 WO 20150224
- International Announcement: WO2016/137449 WO 20160901
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
The resistance state of a memristor in a crossbar array is determined. For instance, a combined reference-sneak current is determined based on a reference voltage, a sense voltage, a non-access voltage, and a voltage applied to a target row line, and a combined read-sneak current is determined based on a read voltage, a sense voltage, a non-access voltage, and a voltage applied to a reference row line. The resistance state of a target memristor is then determined based on the combined reference-sneak current and the combined read-sneak current.
Public/Granted literature
- US20170271003A1 DETERMINING RESISTANCE STATES OF MEMRISTORS IN A CROSSBAR ARRAY Public/Granted day:2017-09-21
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