Invention Grant
- Patent Title: Imaging method and device based on guided wave scattering of omni-directional magneto-acoustic transducers
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Application No.: US15831894Application Date: 2017-12-05
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Publication No.: US10338035B2Publication Date: 2019-07-02
- Inventor: Songling Huang , Kai Song , Wei Zhao , Chao Lu , Yu Zhang , Shen Wang , Jiarui Dong , Zhe Wang
- Applicant: Nanchang Hangkong University , Tsinghua University
- Applicant Address: CN Nanchang CN Beijing
- Assignee: NANCHANG HANGKONG UNIVERSITY,TSINGHUA UNIVERSITY
- Current Assignee: NANCHANG HANGKONG UNIVERSITY,TSINGHUA UNIVERSITY
- Current Assignee Address: CN Nanchang CN Beijing
- Agency: Hodgson Russ LLP
- Priority: CN201710076689 20170213
- Main IPC: G01N29/44
- IPC: G01N29/44 ; G01N29/06 ; G01N29/04 ; G01N29/07 ; G01N29/11 ; G01N29/24

Abstract:
An imaging method based on guided wave scattering of omni-directional EMATs includes: selecting an nth omni-directional EMAT from N omni-directional EMATs uniformly arranged in a detection region of a metal plate to be detected as an excitation EMAT; selecting m omni-directional EMATs as omni-directionally receiving EMATs to omni-directionally receive an ultrasonic guided wave signal, and calculating a travel time and intensity of the ultrasonic guided wave signal; judging whether the excitation EMAT and the omni-directionally receiving EMATs form a scattering group, if yes, calculating a position of a scattering point; judging whether the position of the scattering point is within a preset scattering region, if yes, determining the position of the scattering point as an effective scattering point; repeating the above steps until all N omni-directional EMATs have excited omni-directional ultrasonic guided waves, and performing curve fitting on all effective scattering points to obtain a defect profile image.
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