Invention Grant
- Patent Title: Apparatus for measuring three dimensional shape, method for measuring three dimensional shape and three dimensional shape measurement program
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Application No.: US15148180Application Date: 2016-05-06
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Publication No.: US10347029B2Publication Date: 2019-07-09
- Inventor: Hiroki Unten , Tatsuya Ishii
- Applicant: TOPPAN PRINTING CO., LTD.
- Applicant Address: JP Taito-ku
- Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee: TOPPAN PRINTING CO., LTD.
- Current Assignee Address: JP Taito-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2013-230321 20131106
- Main IPC: G06T15/00
- IPC: G06T15/00 ; G06T17/00 ; G06T7/55

Abstract:
A three-dimensional shape measurement apparatus includes an imaging unit that successively outputs two-dimensional images captured, a memory unit that stores the two-dimensional images outputted by the imaging unit, a three-dimensional shape model generation unit which generates a three-dimensional shape model, based on the two-dimensional images and stores the three-dimensional shape model in the memory unit, a region calculation unit that calculates, based on the two-dimensional images and the three-dimensional shape model stored in the memory unit, a measurement-completed region in the two-dimensional images, and a display image generation unit that generates, based on the measurement-completed region, a display image from the two-dimensional images.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |