Invention Grant
- Patent Title: Systems and methods for reducing temperature sensor reading variation due to device mismatch
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Application No.: US14866371Application Date: 2015-09-25
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Publication No.: US10352775B2Publication Date: 2019-07-16
- Inventor: Dong Pan
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G01K7/01
- IPC: G01K7/01

Abstract:
A temperature sensor is disclosed. The temperature sensor includes an analog core having at least first and second circuit nodes and configured to provide a temperature dependent output, a multiplexer coupled to the first and second circuit nodes and configured for at least first and second states in each of which the first circuit node couples to a different circuit element and in each of which the second circuit node couples to a different circuit element, and a controller coupled to the analog core and configured to provide a temperature measurement that is an average of at least first and second readings of the temperature dependent output of the analog core, the first reading taken while the multiplexer is in the first state, and the second reading taken while the multiplexer is in the second state.
Public/Granted literature
- US20170089766A1 SYSTEMS AND METHODS FOR REDUCING TEMPERATURE SENSOR READING VARIATION DUE TO DEVICE MISMATCH Public/Granted day:2017-03-30
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