Invention Grant
- Patent Title: Level of detail offset determination
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Application No.: US14735707Application Date: 2015-06-10
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Publication No.: US10354431B2Publication Date: 2019-07-16
- Inventor: Abdulkadir U. Diril , Adam T. Moerschell , Anthony P. DeLaurier
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Michael B. Davis
- Main IPC: G06T15/04
- IPC: G06T15/04 ; G06T1/20 ; G09G5/39

Abstract:
Techniques are disclosed relating to determining the location of a specified level of detail for a graphics texture. In some embodiments, an apparatus includes texture processing circuitry configured to receive information specifying a particular mipmap in a chain of stored mipmaps for a graphics texture and determine an offset address for the particular mipmap. In these embodiments, the texture processing circuitry is configured to determine the offset address by operating on a value that indicates a greatest potential chain size for chains of mipmaps in a graphics processing element. In these embodiments, the operating includes masking upper bits of the value based on a size of the texture and masking lower bits of the value based on a position of the specified mipmap in the chain of stored mipmaps. Disclosed techniques may reduce power consumption and/or area of circuitry configured to determine the offset.
Public/Granted literature
- US20160364899A1 Level of Detail Offset Determination Public/Granted day:2016-12-15
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/04 | .纹理映射 |