Invention Grant
- Patent Title: Method of detecting galvanic insulation integrity
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Application No.: US15174092Application Date: 2016-06-06
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Publication No.: US10359383B2Publication Date: 2019-07-23
- Inventor: Zhongfen Ding , Mark R. Jaworowski
- Applicant: United Technologies Corporation
- Applicant Address: US CT Farmington
- Assignee: UNITED TECHNOLOGIES CORPORATION
- Current Assignee: UNITED TECHNOLOGIES CORPORATION
- Current Assignee Address: US CT Farmington
- Agency: Cantor Colburn LLP
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01N27/14 ; G01N17/02

Abstract:
A method of assessing galvanic electronic isolation of two components at a joint of the two components includes measuring a first electrical resistance at a first condition across a joint of two components and comparing the first electrical resistance to a threshold resistance. The comparison of the first electrical resistance to the threshold resistance is indicative of a degree of electrical isolation of the two components. A second electrical resistance is measured at a second condition and the second electrical resistance is compared to the first electrical resistance. The result of the comparison of the second electrical resistance to the first electrical resistance is indicative of a type of electrical connection between the two components.
Public/Granted literature
- US20170350840A1 METHOD OF DETECTING GALVANIC INSULATION INTEGRITY Public/Granted day:2017-12-07
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