Invention Grant
- Patent Title: Methods to characterize formation properties
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Application No.: US14957481Application Date: 2015-12-02
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Publication No.: US10359532B2Publication Date: 2019-07-23
- Inventor: Vikas Jain , Kais Gzara
- Applicant: Schlumberger Technology Corporation
- Applicant Address: US TX Sugar Land
- Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee: SCHLUMBERGER TECHNOLOGY CORPORATION
- Current Assignee Address: US TX Sugar Land
- Main IPC: G01V1/42
- IPC: G01V1/42 ; G01V3/14 ; G01V3/24 ; G01V3/30 ; G01V3/38 ; G01N24/08 ; G01R33/44 ; G01R33/46

Abstract:
A method for analyzing at least one characteristic of a geological formation may include obtaining measured data for the geological formation based upon a logging tool. Measured data may come from multiple passes or multiple depths of investigation. The method may further include generating a kernel describing a known linear mapping between the measured data and unknown data points representing at least one characteristic of the geological formation, and a redundant dictionary including a plurality of different basis functions expected to span the solution space of the unknown data points. The unknown data points representing the at least one characteristic of the geological formation may be determined from the measured data, the kernel and the redundant dictionary based upon an L1 minimization.
Public/Granted literature
- US20160170065A1 Methods to Characterize Formation Properties Public/Granted day:2016-06-16
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