Invention Grant
- Patent Title: Method and system for analyzing skin lesions
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Application No.: US15607178Application Date: 2017-05-26
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Publication No.: US10362985B2Publication Date: 2019-07-30
- Inventor: Francesco Rundo , Giuseppe Luigi Banna
- Applicant: STMicroelectronics S.r.l.
- Applicant Address: IT Agrate Brianza (MB)
- Assignee: STMicroelectronics S.r.l.
- Current Assignee: STMicroelectronics S.r.l.
- Current Assignee Address: IT Agrate Brianza (MB)
- Agency: Slater Matsil, LLP
- Priority: IT102016000121060 20161129
- Main IPC: G06T5/00
- IPC: G06T5/00 ; A61B5/00 ; G06T7/00 ; A61B5/103 ; A61B5/107

Abstract:
A method can be used for analyzing digital images of skin lesions. The images include pixels distributed over a lesion area. Sets of values including a first discrimination value indicative of a weighted average of the image pixels with weighing at the border of the lesion, a second discrimination value indicative of skewness and kurtosis of the distribution of the image pixels, a third discrimination value indicative of the ratio of symmetry and gray-level power of the distribution of the image pixels and calculated. A total additive score of the values in the sets of values is provided and compared with a total score threshold. The first, second and third discrimination values are compared with respective first, second and third discrimination threshold values. An output classification for the image analyzed is provided as a function of the results of the comparing.
Public/Granted literature
- US20180146912A1 METHOD AND SYSTEM FOR ANALYZING SKIN LESIONS Public/Granted day:2018-05-31
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