Invention Grant
- Patent Title: Surface gratings, photonics circuit, and method for wafer-level testing thereof
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Application No.: US15788553Application Date: 2017-10-19
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Publication No.: US10365435B1Publication Date: 2019-07-30
- Inventor: Samira Karimelahi , Masaki Kato
- Applicant: INPHI CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: INPHI CORPORATION
- Current Assignee: INPHI CORPORATION
- Current Assignee Address: US CA Santa Clara
- Agency: Ogawa P.C.
- Agent Richard T. Ogawa
- Main IPC: G02B6/124
- IPC: G02B6/124 ; G02B6/125 ; G02B6/126 ; G02B6/27 ; G02B6/122 ; G02B6/30 ; G01M11/00 ; G02B6/12

Abstract:
A surface grating coupler for polarization splitting or diverse includes a planar layer and an array of scattering elements arranged in the planar layer at intersections of a first set of concentric elliptical curves crossing with a second set of concentric elliptical curves rotated proximately 90 or 180 degrees to form a two-dimensional (2D) grating. Additionally, the grating coupler includes a first waveguide in double-taper shape and a second waveguide in double-taper shape respectively for split or diverse an incident light into the 2D grating into two output light to two output ports with a same (either TE or TM) polarization mode or one output port with TE polarization mode and another output port with TM polarization mode. The polarization diverse grating coupler is required to test multiple polarization sensitive photonics components and can be used with other single polarization grating coupler via a fiber array to perform wafer-level testing.
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