Invention Grant
- Patent Title: Control method of profile measuring apparatus
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Application No.: US15638932Application Date: 2017-06-30
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Publication No.: US10365630B2Publication Date: 2019-07-30
- Inventor: Takashi Noda , Hiromi Deguchi , Norihiko Murata
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2016-139816 20160714
- Main IPC: G01B21/04
- IPC: G01B21/04 ; G01B21/20 ; G01B5/008 ; G05B19/04 ; G05B19/401

Abstract:
A probe displacement command in a scanning measurement is generated according to a composite speed vector V: V=Gf·Vf+Ge·Ve+sp(p)·Gc·Vc2 wherein Vf is a vector along which a probe is displaced along a scanning path, Ve is a vector maintaining a deflection amount of the probe toward a work piece at a standard deflection amount. Vc2 is represented by (Vc1·q)q, Vc1 is a vector in a direction correcting a probe position such that a stylus tip is oriented along a scanning course, q is a vector given by a vector product of the normal line of a surface of the work piece and Vf, The normal direction of a measured surface is designated as Nw, p is a scalar product of Vc2 and Nw, and sg(p) is a function returning +1 or −1 in accordance with a value of p.
Public/Granted literature
- US20180017954A1 CONTROL METHOD OF PROFILE MEASURING APPARATUS Public/Granted day:2018-01-18
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