Invention Grant
- Patent Title: Methods of patterning variable width metallization lines
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Application No.: US15861799Application Date: 2018-01-04
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Publication No.: US10366917B2Publication Date: 2019-07-30
- Inventor: Xuelian Zhu , Jia Zeng , Chenchen Wang , Jongwook Kye
- Applicant: GLOBALFOUNDRIES Inc.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee: GLOBALFOUNDRIES Inc.
- Current Assignee Address: KY Grand Cayman
- Agency: Thompson Hine LLP
- Agent Anthony Canale
- Main IPC: H01L21/48
- IPC: H01L21/48 ; H01L21/768

Abstract:
Methods of patterning metallization lines having variable widths in a metallization layer. A first mandrel layer is formed over a mask layer, with the mask layer overlying a second mandrel layer. The first mandrel layer is etched to form mandrel lines that have variable widths. The first non-mandrel trenches are etched in the mask layer, where the non-mandrel trenches have variable widths. The first mandrel lines are used to etch mandrel trenches in the mask layer, so that the mandrel lines and first non-mandrel lines define a mandrel pattern. The second mandrel layer is etched according to the mandrel pattern to form second mandrel lines, with the second mandrel lines having the variable widths of the plurality of first mandrel lines and the variable widths of the plurality of non-mandrel trenches.
Public/Granted literature
- US20190206717A1 METHODS OF PATTERNING VARIABLE WIDTH METALLIZATION LINES Public/Granted day:2019-07-04
Information query
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