Embodiments of an electrostatic discharge (ESD) protection device and a method of operating an ESD protection device are described. In one embodiment, an ESD protection device includes an NMOS transistor configured to shunt current in response to an ESD pulse and a bigFET connected in parallel with the NMOS transistor. The NMOS transistor includes a source terminal, a gate terminal, and a body. The gate terminal and the body of the NMOS transistor are connected to the source terminal via a resistor. Other embodiments are also described.