Optical configurations for optical field mappings for back-scanned and line-scanned imagers
Abstract:
Examples are directed to optimal field mappings that provide the highest contrast images for time delay integration (TDI) imaging systems and methods. The mapping can be implemented for line-scanned imaging with optical systems including an anamorphic field correcting assembly configured to implement a non-rotationally symmetric field mapping between object space and image space to adjust distortion characteristics of the optics to control image wander on a focal plane array. The anamorphic field correcting assembly can include one or more mirrors or lenses having non-rotationally symmetric aspherical departures.
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