Invention Grant
- Patent Title: Power supply apparatus and a test system including the same
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Application No.: US15584486Application Date: 2017-05-02
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Publication No.: US10381925B2Publication Date: 2019-08-13
- Inventor: Seong-Kwan Lee , Sung-Chul Chun , Sung-Yeol Kim , Jae-Hong Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0133090 20161013
- Main IPC: H02M3/156
- IPC: H02M3/156 ; G01R1/30 ; H02M3/02 ; H02M1/00

Abstract:
A power supply apparatus includes first through M-th switching regulators, first through N-th multiplexers, and first through N-th linear regulators, where each of M and N is a natural number greater than or equal to two. The first through M-th switching regulators generate first through M-th reference power signals using an input power signal. The first through N-th multiplexers select one of the first through M-th reference power signals, in response to a power selection signal, to provide first through N-th selection power signals. The first through N-th linear regulators generate first through N-th output power signals using the first through N-th selection power signals. The first through N-th linear regulators are connected to the first through N-th multiplexers, respectively.
Public/Granted literature
- US20180109184A1 POWER SUPPLY APPARATUS AND A TEST SYSTEM INCLUDING THE SAME Public/Granted day:2018-04-19
Information query
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