Invention Grant
- Patent Title: Microtome waste removal assembly
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Application No.: US15811447Application Date: 2017-11-13
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Publication No.: US10422724B2Publication Date: 2019-09-24
- Inventor: Xuan S. Bui , Alyicia Marie Rios , Erico Von Bueren
- Applicant: Sakura Finetek U.S.A., Inc.
- Applicant Address: US CA Torrance
- Assignee: Sakura Finetek U.S.A., Inc.
- Current Assignee: Sakura Finetek U.S.A., Inc.
- Current Assignee Address: US CA Torrance
- Agency: Leech Tishman Fuscaldo & Lampl
- Agent William Thomas Babbitt
- Main IPC: G01N1/06
- IPC: G01N1/06 ; B26D7/01 ; B26D7/27 ; H05B33/08 ; G01N1/31 ; G01N21/25

Abstract:
A sample sectioning device including a housing having a base member, a cutting mechanism positioned on the base member and operable to cut sections from a sample, a sample holder dimensioned to hold a sample and operable to move with respect to the cutting mechanism during a cutting operation, and a waste removal assembly positioned below the cutting mechanism and the sample holder, the waste removal assembly having a first member and a second member that are dimensioned to remove waste produced during the cutting operation.
Public/Granted literature
- US20180136087A1 MICROTOME WASTE REMOVAL ASSEMBLY Public/Granted day:2018-05-17
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