Invention Grant
- Patent Title: Apparatus and method for mass spectrometry
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Application No.: US15560692Application Date: 2016-03-18
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Publication No.: US10424470B2Publication Date: 2019-09-24
- Inventor: Christian Tanner , Martin Tanner , Marc Gonin
- Applicant: TOFWERK AG
- Applicant Address: CH Thun
- Assignee: TOFWERK AG
- Current Assignee: TOFWERK AG
- Current Assignee Address: CH Thun
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: CH429/15 20150325
- International Application: PCT/EP2016/056030 WO 20160318
- International Announcement: WO2016/150875 WO 20160929
- Main IPC: H01J49/00
- IPC: H01J49/00 ; H01J49/04 ; H01J49/10 ; G01N27/62 ; H04L1/16 ; H04L1/18

Abstract:
An apparatus for mass spectrometry comprises a portion generator (10) for creating localized analyte portions in synchronization with trigger pulses, a transfer system (20) coupled to the portion generator (10) for transporting the localized analyte portions, a plasma ionizer unit (30) coupled to the transfer system (20) for atomizing, vaporizing and ionizing received analyte portions with plasma, a mass analyzer (41) coupled to the plasma ionizer unit (30) for analyzing received analyte portions, the mass analyzer (41) comprising at least one detector, and a data acquisition electronics (50) connected to the at least one detector for acquiring signals (43) generated by the at least one detector. The apparatus further includes a signal delay device (60) for receiving the trigger pulses (11) and delivering delayed signals (61) corresponding to the trigger pulses to account for a delay experienced by the particles to be analyzed between portion generation and detection.
Public/Granted literature
- US20180254176A1 APPARATUS AND METHOD FOR MASS SPECTROMETRY Public/Granted day:2018-09-06
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