Invention Grant
- Patent Title: Method of estimating remaining life of solid state drive device
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Application No.: US15706923Application Date: 2017-09-18
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Publication No.: US10430308B2Publication Date: 2019-10-01
- Inventor: Yusuf Cinar
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2016-0174493 20161220; KR10-2017-0009738 20170120
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/30 ; G06F11/34 ; G06F11/24 ; G06F11/22

Abstract:
A method for estimating the remaining life of a solid state drive (SSD) device includes generating a sensing value by periodically measuring an environmental variable, generating a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device, calculating stress applied to the SSD device based on the load value, calculating damage of the SSD device based on a stress-life curve and the stress, and determining the remaining life of the SSD device based on a difference between a threshold value and the damage. The stress-life curve may represent a relationship between the stress and life of the SSD device.
Public/Granted literature
- US20180173602A1 METHOD OF ESTIMATING REMAINING LIFE OF SOLID STATE DRIVE DEVICE Public/Granted day:2018-06-21
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