公开(公告)号：US11693725B2

公开(公告)日：2023-07-04

申请号：US17536817

申请日：2021-11-29

申请人： ADVANCED MICRO DEVICES, INC.

发明人： Johnathan Alsop ,  Shaizeen Aga

IPC分类号： G06F11/07 ,  G06F11/24 ,  G06F11/14

CPC分类号： G06F11/0772 ,  G06F11/141 ,  G06F11/1471 ,  G06F11/24

摘要： Detecting execution hazards in offloaded operations is disclosed. A second offload operation is compared to a first offload operation that precedes the second offload operation. It is determined whether the second offload operation creates an execution hazard on an offload target device based on the comparison of the second offload operation to the first offload operation. If the execution hazard is detected, an error handling operation may be performed. In some examples, the offload operations are processing-in-memory operations.

公开(公告)号：US11520651B2

公开(公告)日：2022-12-06

申请号：US17399531

申请日：2021-08-11

申请人： Bank of America Corporation

发明人： Surina Puri ,  Asif Ahmad Bala ,  Arjun Thimmareddy

IPC分类号： G06F11/07 ,  G06F11/30 ,  G06F11/24

摘要： A tool may identify and revert changes that caused network hardware components or hardware servers to malfunction. The tool builds and maintains a graph that represents the hardware components and servers in the system and their dependencies. When a change is made to the system, links and weights in the graph are adjusted to account for the changes. When a component or server is reported as malfunctioning, the tool traverses the graph to locate the changes that are the most likely root causes of the malfunction. The tool may then revert the change to resolve the malfunction.

公开(公告)号：US20220012113A1

公开(公告)日：2022-01-13

申请号：US17399531

申请日：2021-08-11

申请人： Bank of America Corporation

发明人： Surina Puri ,  Asif Ahmad Bala ,  Arjun Thimmareddy

IPC分类号： G06F11/07 ,  G06F11/24 ,  G06F11/30

摘要： A tool may identify and revert changes that caused network hardware components or hardware servers to malfunction. The tool builds and maintains a graph that represents the hardware components and servers in the system and their dependencies. When a change is made to the system, links and weights in the graph are adjusted to account for the changes. When a component or server is reported as malfunctioning, the tool traverses the graph to locate the changes that are the most likely root causes of the malfunction. The tool may then revert the change to resolve the malfunction.

公开(公告)号：US20210406144A1

公开(公告)日：2021-12-30

申请号：US17359261

申请日：2021-06-25

申请人： Tektronix, Inc.

发明人： Sam J. Strickling ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC分类号： G06F11/26 ,  G06F11/24

摘要： A test and measurement system for analyzing a device under test, including a database configured to store test results related to tests performed with one or more prior devices under test, a receiver to receive new test results about a new device under test, a data analyzer configured to analyze the new test results based on the stored test results, and a health score generator configured to generate a health score for the new device under test based on the analysis from the data analyzer.

公开(公告)号：US10402291B2

公开(公告)日：2019-09-03

申请号：US15523148

申请日：2015-09-18

申请人： Robert Bosch GmbH

发明人： Matthias Kalisch ,  Ali Abbas Husaini ,  Christian Pfahler

IPC分类号： G06F11/00 ,  G06F11/27 ,  G08C25/00 ,  H04Q9/00 ,  B60R21/01 ,  G06F11/24

摘要： A checking device for a data preparation unit, including a preparation element for preparing sensor data for a data transmission; and a comparator for comparing the sensor data with the prepared sensor data; a fault of the data preparation unit being detected in the event that the prepared sensor data do not match the sensor data.

公开(公告)号：US10331531B2

公开(公告)日：2019-06-25

申请号：US15447673

申请日：2017-03-02

申请人： ARM Limited

发明人： Balaji Venu ,  Kauser Yakub Johar ,  Marco Bonino

IPC分类号： G06F11/07 ,  G06F11/22 ,  G06F11/24 ,  G06F11/27 ,  G06F11/273

摘要： Apparatus and a method for processor core self-testing are disclosed. The apparatus comprises processor core circuitry to perform data processing operations by executing data processing instructions. Separate self-test control circuitry causes the processor core circuitry to temporarily switch from a first state of executing the data processing instructions to a second state of executing a self-test sequence of instructions, before returning to the first state of executing the data processing instructions without a reboot of the processor core circuitry being required. There is also self-test support circuitry, wherein the processor core circuitry is responsive to the self-test sequence of instructions to cause an export of at least one self-test data item via the self-test support circuitry to the self-test control circuitry.

公开(公告)号：US10254338B2

公开(公告)日：2019-04-09

申请号：US15221211

申请日：2016-07-27

申请人： STMICROELECTRONICS S.R.L.

发明人： Nicolas Bernard Grossier ,  Lorenzo Guerrieri ,  Giuseppe Livio Gobbato ,  Daniele Zerbini ,  Martina Cordoni ,  Pasqualina Fragneto

IPC分类号： G01R31/3177 ,  G01R31/317 ,  H04B3/54 ,  H02J13/00 ,  H05B37/02 ,  G06F11/30 ,  G01R31/28 ,  G06F11/36 ,  G06F11/24 ,  G06F1/26

摘要： A semiconductor device, for example an integrated circuit such as a microcontroller (MCU) or a digital signal processor (DSP), includes a semiconductor die coupled with a power supply line, a debug module coupled with the semiconductor die to exchange semiconductor die debug command and data signals with the semiconductor die, and a modem coupled with the power supply line. The debug module is arranged to convey the semiconductor die debug command and data signals over the power supply line.

公开(公告)号：US10078544B2

公开(公告)日：2018-09-18

申请号：US14975751

申请日：2015-12-19

申请人： Intel Corporation

发明人： Clark N. Vandam ,  Balkaran Gill ,  Junho Song ,  Suriya Suriya Ashok Kumar ,  Kasyap Pasumarthi

IPC分类号： G06F11/00 ,  G06F11/07 ,  G06F11/22 ,  G06F11/24 ,  G06F11/27

CPC分类号： G06F11/0793 ,  G06F11/0721 ,  G06F11/0751 ,  G06F11/079 ,  G06F11/2236 ,  G06F11/24 ,  G06F11/27

摘要： An apparatus and method are described for an on-chip reliability controller. For example, one embodiment of a processor comprises: a set of one or more cores to execute instructions and process data; a reliability controller to perform one or more self-test/diagnostic operations, the reliability controller to aggregate reliability data resulting from the self-test/diagnostic operations; a reliability estimator integral to the reliability controller to use the aggregated reliability data to perform a probability analysis to determine reliability estimates for one or more components of the processor; and a control unit integral to the reliability controller to adjust one or more variables and/or circuitry related to operation of the processor responsive to the reliability estimates.

公开(公告)号：US09558088B2

公开(公告)日：2017-01-31

申请号：US14090962

申请日：2013-11-26

申请人： International Business Machines Corporation

发明人： Djihed Afifi ,  Matthew J. Jarvis

IPC分类号： G06F11/24

CPC分类号： G06F11/24

摘要： Method and system are provided for using environmental signatures for test scheduling. The method includes: generating an environmental signature for a test including the usage of power and temperature of one or more hardware components being tested; determining an outcome score of the test; and scheduling one or more tests on hardware components based on the environmental signature and outcome score of candidate tests. Generating an environmental signature for a test may include: monitoring the usage of power by hardware components during the course of the test; monitoring the temperature of hardware components during the course of the test; generating a signature representing the power usage and temperature during the test. Determining an outcome score of the test may include determining the number of defects exposed by a test and basing the outcome score on the number of defects exposed.

摘要翻译： 提供了使用环境签名进行测试调度的方法和系统。 该方法包括：生成用于测试的环境签名，包括正被测试的一个或多个硬件组件的功率和温度的使用; 确定测试的结果得分; 并基于候选测试的环境签名和结果分数，对硬件组件进行一个或多个测试。 为测试生成环境签名可能包括：在测试过程中监视硬件组件的功率使用情况; 在测试过程中监测硬件组件的温度; 在测试期间生成代表功率使用和温度的签名。 确定测试的结果分数可以包括确定通过测试暴露的缺陷的数量，并将结果得分基于暴露的缺陷数量。

公开(公告)号：US09514020B2

公开(公告)日：2016-12-06

申请号：US14312036

申请日：2014-06-23

申请人： Dell Products L.P.

发明人： Richard Martin Tonry ,  Nikolai V. Vyssotski

IPC分类号： G06F1/26 ,  G06F11/30 ,  G06F11/32 ,  G06F11/07 ,  G06F11/22 ,  G06F11/24

CPC分类号： G06F11/3062 ,  G06F11/07 ,  G06F11/0706 ,  G06F11/0751 ,  G06F11/0766 ,  G06F11/0769 ,  G06F11/2284 ,  G06F11/24 ,  G06F11/3065 ,  G06F11/321

摘要： A power profile diagnostic system includes a power rail. At least one subsystem is coupled to the power rail. A controller is coupled to the power rail and to a power profile database. The controller is configured to monitor the power rail and determine a power consumption profile of the at least one subsystem during a predefined operation of the at least one subsystem. The controller then compares the power consumption profile to a predetermined power profile that is stored in the power profile database in association with the predefined operation, and determines whether a difference between the predetermined power profile and the power consumption profile is indicative of a malfunction of the at least one subsystem. If the difference between the predetermined power profile and the power consumption profile is indicative of the malfunction of the at least one subsystem, the controller provide a malfunction report for display.

摘要翻译： 电源配置文件诊断系统包括电源轨。 至少一个子系统耦合到电力轨。 控制器耦合到电源轨和电源配置文件数据库。 所述控制器被配置为在所述至少一个子系统的预定义操作期间监视所述电源轨并确定所述至少一个子系统的功耗曲线。 然后，控制器将功耗曲线与预定义的操作相关联地存储在功率曲线数据库中的预定功率曲线进行比较，并且确定预定功率曲线和功耗曲线之间的差是否表示 至少一个子系统。 如果预定功率曲线和功耗曲线之间的差异指示至少一个子系统的故障，则控制器提供用于显示的故障报告。