The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.