Invention Grant
- Patent Title: Methods and apparatus for test insertion points
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Application No.: US15347619Application Date: 2016-11-09
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Publication No.: US10473717B2Publication Date: 2019-11-12
- Inventor: Wilson Pradeep
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Ebby Abraham; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/3177 ; G01R31/3185 ; G01R31/3183
Abstract:
Described examples include a method of providing K bits of test data to a combinatorial circuit. The method further includes generating N bits of test data using the combinatorial circuit, where N is greater than K. The method further includes providing the N bits of test data to a module under test.
Public/Granted literature
- US20180128877A1 Methods and Apparatus for Test Insertion Points Public/Granted day:2018-05-10
Information query
