Invention Grant
- Patent Title: Methods and systems to detect and correct outliers in a dataset stored in a data-storage device
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Application No.: US15811710Application Date: 2017-11-14
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Publication No.: US10474667B2Publication Date: 2019-11-12
- Inventor: Chandrashekhar Jha , Jobin George , Prateek Sahu , Kumar Gaurav , Jusvinder Singh
- Applicant: VMWARE, INC.
- Applicant Address: US CA Palo Alto
- Assignee: VMware, Inc
- Current Assignee: VMware, Inc
- Current Assignee Address: US CA Palo Alto
- Priority: IN201741027021 20170729
- Main IPC: G06F16/23
- IPC: G06F16/23 ; G06F3/06 ; G06F16/25 ; G06F16/22 ; G06F16/951

Abstract:
Methods and systems are directed to detection and correction of outliers in a dataset stored in a data-storage device. The dataset comprises parameter data that may be stored and organized in the form of a data table with rows and columns of parameter values. Each column of the parameter data is searched for outlier parameter values based on the parameters values in the same column. The parameter data as a whole may be searched for outlier rows of parameter values based on first and second largest variations in the parameter data. Substitute parameter values are determined for the outlier parameter values based on non-outlier parameter values of the parameter data. The substitute parameter values and corresponding outlier parameter values may be displayed in a database management user interface that enables a user to selectively accept or reject each of the substitute parameter values for the corresponding outlier parameter values.
Public/Granted literature
- US20190034473A1 METHODS AND SYSTEMS TO DETECT AND CORRECT OUTLIERS IN A DATASET STORED IN A DATA-STORAGE DEVICE Public/Granted day:2019-01-31
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