Invention Grant
- Patent Title: Method for detecting defects of glass substrates
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Application No.: US15816943Application Date: 2017-11-17
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Publication No.: US10481053B2Publication Date: 2019-11-19
- Inventor: Cheol Min Park , Jeong Woo Park , Seung Kim , Seung Ho Kim , Hoi Kwan Lee , Woo Jin Cho , Hee Kyun Shin , Hyun Joon Oh
- Applicant: Samsung Display Co., Ltd.
- Applicant Address: KR Yongin-si
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR Yongin-si
- Agency: Lewis Roca Rothgerber Christie LLP
- Priority: KR10-2016-0153327 20161117
- Main IPC: G01N1/30
- IPC: G01N1/30 ; G01N21/958 ; G01N21/91 ; C03C15/00 ; C03C19/00 ; C03C23/00 ; G02F1/13 ; G02F1/1333 ; H01L51/00

Abstract:
A method of detecting defects of a glass substrate includes cutting a glass mother substrate into a plurality of glass substrates, penetrating ions into an incision surface of the glass substrate to visualize defects of the incision surface, and photographing the defects of the incision surface to determine a bending strength of the glass substrate based on a size of the defects.
Public/Granted literature
- US20180136095A1 METHOD FOR DETECTING DEFECTS OF GLASS SUBSTRATES Public/Granted day:2018-05-17
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