Invention Grant
- Patent Title: Method for screening bad data columns in data storage medium
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Application No.: US16028891Application Date: 2018-07-06
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Publication No.: US10481796B2Publication Date: 2019-11-19
- Inventor: Sheng-Yuan Huang , Yu-Ping Chang
- Applicant: SILICON MOTION, INC.
- Applicant Address: TW Jhubei
- Assignee: SILICON MOTION, INC.
- Current Assignee: SILICON MOTION, INC.
- Current Assignee Address: TW Jhubei
- Priority: TW105114620A 20160511
- Main IPC: G06F3/06
- IPC: G06F3/06 ; G11C29/44 ; G11C29/00 ; G11C29/52

Abstract:
A method for screening bad data columns in a data storage medium comprising a plurality of data columns includes: labeling or recording a plurality of bad data columns as a bad data column group, wherein the bad data columns are selected from the data columns in the data storage medium, each of the bad data column groups labels or records a position and a number of the bad data columns; determining whether the total number of the bad data columns is greater than a total number of the bad data column groups; and if yes, labeling or recording any two bad data columns of the bad data columns spaced apart by P data columns as one of the bad data column groups, wherein P is a positive integer.
Public/Granted literature
- US20180314428A1 METHOD FOR SCREENING BAD DATA COLUMNS IN DATA STROAGE MEDIUM Public/Granted day:2018-11-01
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