- 专利标题: Circuit arrangement and method for controlling and measuring a current in a charge element
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申请号: US16027129申请日: 2018-07-03
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公开(公告)号: US10530122B2公开(公告)日: 2020-01-07
- 发明人: Thomas Bellingrath
- 申请人: Silicon Line GmbH
- 申请人地址: DE Munich
- 专利权人: Silicon Line GmbH
- 当前专利权人: Silicon Line GmbH
- 当前专利权人地址: DE Munich
- 代理机构: Studebaker & Brackett PC
- 优先权: EP16150111 20160104
- 主分类号: H01S3/00
- IPC分类号: H01S3/00 ; H01S5/026 ; H01S5/068 ; H01S5/042 ; G05F1/10 ; G01R19/00 ; H05B33/08
摘要:
In order to provide a circuit arrangement and a method for controlling and measuring a current in at least one charge element, in particular in at least one laser diode, which can be used at a low operating voltage with laser current control and/or at a low drop in voltage, also for so-called “low power” applications, it is proposed to couple three MOSFETs in a split manner for a charge path and for two measurement paths and to maintain the three MOSFETs by means of an auxiliary controller at the same working point such that they deliver the modulation current and comparison currents fixed with respect to the modulation current. The comparison currents are used to determine the average modulation current and feed a control device which delivers these currents—and thus also the average modulation current—to a desired value in which an operational or control voltage is varied on a circuit block by the control device. The circuit block delivers output signals depending on the operational or control voltage in the amplitude, said output signals controlling two or more circuit elements in the charge path and the measurement paths.
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