发明授权
- 专利标题: Calibration arrangement and a method for a microwave analyzing or measuring instrument
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申请号: US15565163申请日: 2016-04-04
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公开(公告)号: US10534061B2公开(公告)日: 2020-01-14
- 发明人: Vessen Vassilev , Per-Simon Kildal , Sofia Rahiminejad
- 申请人: Gapwaves AB
- 申请人地址: SE Gothenburg
- 专利权人: GAPWAVES AB
- 当前专利权人: GAPWAVES AB
- 当前专利权人地址: SE Gothenburg
- 代理机构: Melcher Patent Law PLLC
- 代理商 Jeffrey S. Melcher
- 优先权: SE1550412 20150408
- 国际申请: PCT/SE2016/050277 WO 20160404
- 国际公布: WO2016/163932 WO 20161013
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; G01R35/00 ; G01R27/28
摘要:
An apparatus for calibration of an electronic instrument, such as a vector network analyzer, includes a number of calibrator connector elements for connection to the instrument, and a plate element including a plurality of calibration waveguide structures. The plate element has conductive surfaces, and the calibrator connector elements and conductive surfaces include periodic structures disposed with respect to each other such that gaps are formed between them. An interface enables interconnection of a waveguide of a calibrator connector element, a waveguide of the instrument, and a calibration waveguide structure. The apparatus includes a driving unit and controller for moving the plate element and/or the calibrator connector element to connect the calibrator connector element to different calibration waveguide structures.
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